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Publication Type:

Journal Article

Authors:

Petrus, J. A.; Ross, K. C.; McDonald, A. M.

Source:

Computers & GeosciencesComputers & Geosciences, Volume 38, Number 1, p.156-163 (2012)

ISBN:

0098-3004

Accession Number:

WOS:000298524100017

Keywords:

data reduction, debye-scherrer, films, gandolfi, image plate, mineral identification, x-ray diffraction software

Abstract:

A new program capable of rapidly and accurately reducing a two-dimensional X-ray diffraction pattern obtained from a Debye-Scherrer or Gandolfi camera to a quantitative digital diffractogram is described. By implementing geometric optimization routines based on the symmetry and sharpness of diffraction lines, the optimal configuration of the camera, X-ray path, and sample can be determined, thus providing the best possible set of integration parameters. Results for NISI standard reference materials 640c (Si) and 676 (Al(2)O(3)) are included to illustrate program functionality. (C) 2011 Elsevier Ltd. All rights reserved.

Notes:

868lf<br/>Times Cited:4<br/>Cited References Count:20